元件電路計測實驗

Device and Circuit Characterization Laborotory

學期

107-1

學分

3 學分

當期課號

5009

永久課號

IEE5385

開課單位

電子研究所

授課教師

侯拓宏

類別

選修

上課時間表

節	週一
5 13:20–14:10	元件電路計測實驗 LAB 3 節連堂
6 14:20–15:10
7 15:30–16:20

* 根據陽明交大上課時間表所列

概述

The graduate-level course teaches fundamental DC and AC measurements for semiconductor devices with special emphasis on the MOSFET characterization. Students are expected to learn essential instrumentation and testing theory through both classroom lectures and hands-on experiment sessions. Prior knowledge on the semiconductor device physics is highly recommended.

先修科目

Semiconductor Device Physics

教學方式

https://dcpc.nctu.edu.tw/

評分方式

Experimental report : group reports, 20% Operational examination : 3 examinations, 30% Written examination : 3 examinations, 30% Class & Lab participation : 20%

教科書

1. Class Notes 2. D. K. Schroder, Semiconductor Material and Device Characterization, 3rd ed., Wiley Interscience

Office Hours

地點: ED409
時間: By appointment
聯絡方式: thhou@mail.nctu.edu.tw