材料分析
Material Analysis
| 節 | 週五 |
|---|---|
5 13:20–14:10 | 材料分析 ED201 3 節連堂 |
6 14:20–15:10 | |
7 15:30–16:20 |
* 根據陽明交大上課時間表所列
Understanding the basic principles and applications of various material analysis instruments for future electronic devices research. Practicing English presentation skills of material analysis research.
Basic physic and chemistry concepts.
ChemSpider Search and share chemistry: http://www.chemspider.com/StructureSearch.aspx X-ray Absorption Edges: http://skuld.bmsc.washington.edu/scatter/AS_periodic.html American Mineralogist Crystal Structure Database: http://rruff.geo.arizona.edu/AMS/amcsd.php
隨堂小考 Quiz 10% 口頭研究報告 Oral research topic presentation 30% 出席 Attend 20% 期中考 Midterm exam 20% 期末考 Term exam 20%
| 週次 | 主題 |
|---|---|
| 第 1 週 | Introduction |
| 第 2 週 | Light Microscopy |
| 第 3 週 | X-Ray Diffraction Methods |
| 第 4 週 | Transmission Electron Microscopy |
| 第 5 週 | Transmission Electron Microscopy |
| 第 6 週 | Scanning Electron Microscopy |
| 第 7 週 | Scanning Probe Microscopy |
| 第 8 週 | Oral presentation |
| 第 9 週 | Oral presentation |
| 第 10 週 | Oral presentation |
| 第 11 週 | Midterm Exam |
| 第 12 週 | X-Ray Spectroscopy for Elemental Analysis |
| 第 13 週 | Electron Spectroscopy for Surface Analysis |
| 第 14 週 | Secondary Ion Mass Spectrometry for Surface Analysis |
| 第 15 週 | Vibrational Spectroscopy for Molecular Analysis |
| 第 16 週 | Oral presentation |
| 第 17 週 | Oral presentation |
| 第 18 週 | Term exam |
Materials characterization: introduction to microscopic and spectroscopic methods Leng, Y. (Yang) Weinheim, Germany: Wiley-VCH, c2013. 2nd ed.. c2013 Transmission electron microscopy : diffraction, imaging, and spectrometry Springer eBooks Cham : Springer International Publishing : Imprint: Springer, 2016. 2016