積體電路之靜電防護設計特論

本課程講授積體電路產品可靠度上的一項專業技術:『積體電路之靜電放電(ESD, Electrostatic Discharge)防護設計』,其中包括靜電放電工業標準、靜電放電測試方法、靜電放電防護方法、半導體製程因素、防護元件設計、防護元件佈局方式、靜電放電防護電路設計、全晶片防護架構設計、系統規格(system-level)之靜電放電防護方法、以及閂鎖效應(Latchup)。

電路學, 電子學, 積體電路相關課程等。需具備「積體電路」設計、佈局、與製造的經驗或背景知識。

課程進行方式 : 投影片教學(Projector) 課程講義: 影印發放 + 自行購買

作業部份: 期末報告 考試部份: 期中考試/期末考試 依照學校規定舉行 評量部份: 學期成績 = (期中考試 25%) + (期末考試 25%) + (期中作業+期末報告 50%)

• 1. Introduction to ESD (Electrostatic Discharge). 2. Industrial Standards on ESD Events. 3. ESD Testing on IC Products. 4. Transmission-Line Pulse Generator (TLPG). 5. Design Concepts of On-Chip ESD Protection. 6. Process Issues on ESD Robustness of CMOS IC. 7. Device Issues on ESD Robustness of CMOS IC. 8. Layout Issues on ESD Robustness of CMOS IC. 9. Circuit Issues on ESD Robustness of CMOS IC. 10. Whole-Chip ESD Protection Scheme. 11. ESD Protection Design for Mixed-Voltage I/O. 12. ESD Protection Design for RF Circuits. 13. ESD Protection Design for Charged-Device-Model ESD events. 14. ESD Protection in High-Voltage CMOS IC. 15. System-Level ESD Protection. 16. Latchup Prevention in CMOS IC. 17. Case Study.

參考書目: 1. A. Amerasekera and C. Duvvury, ESD in Silicon Integrated Circuits, John Wiley & Sons, 2nd Edition, 2002. (TI) 2. S. Voldman, ESD : Circuits and Devices, John Wiley & Sons, 2006. (IBM) 3. S. Voldman, ESD : RF Technology and Circuits, John Wiley & Sons, 2006. (IBM) 4. S. Dabral and T. Maloney, Basic ESD and I/O Design, John Wiley & Sons, 1988. (Intel) 5. S. Voldman, ESD : Physics and Devices, John Wiley & Sons, 2004. (IBM) 6. A. Wang, On-Chip ESD Protection for Integrated Circuits, Kluwer, 2002. (AMD) 7. M.-D. Ker and S.-F. Hsu, Transient-Induced Latchup in CMOS Integrated Circuits, John Wiley & Sons, 2009. (NCTU, Taiwan) 8. S. Voldman, Latchup. Hoboken, NJ: Wiley, 2007. 9. V. A. Vashchenko and A. Shibkov, ESD Design for Analog Circuits, Springer, 2010. (Maxim) 10. O. Semenov, H. Sarbishaei, and M. Sachdev, ESD Protection Device and Circuit Design for Advanced CMOS Technologies, Springer, 2010. (Univ. of Waterloo) 11. Electrostatic Discharge Protection: Advances and Applications, edited by Juin J. Liou, CRC Press, 2016. (ISBN : 978-1482255881 ) 12. Papers in the International Journals and Transactions. 13. Papers in the Proceedings of International Conferences. 14. Papers in the Proceedings of EOS/ESD Symposium. 15. International Standards. 16. US Patents.

地點

ED-307

時間

PM 4:00 - 5:30, Monday.

聯絡方式

助教: 薛承昀 [ william0750217.ee07g@nctu.edu.tw ]