光學顯微技術
Advanced light microscopy
學期
108-2
學分
2
學分
當期課號
B597
永久課號
A1709
開課單位
腦科學研究所
授課教師
陳摘文、蔡金吾
校區
陽明
類別
選修
上課時間表
| 節 | 週五 |
|---|---|
3 10:10–11:00 | 光學顯微技術 YL839 2 節連堂 |
4 11:10–12:00 |
* 根據陽明交大上課時間表所列
週次計畫
| 週次 | 主題 |
|---|---|
| 第 1 週 | 緒論: 光學與成像原理Introduction: Optics and Imaging |
| 第 2 週 | 光學顯微鏡基本構造Basic components of a light microscope |
| 第 3 週 | 常用光學顯微鏡技術: Bright field, Dark field, Rheinberg illumination, Phase contrastTechniques in microscopy: Bright field, Dark field, Rheinberg illumination, Phase contrast |
| 第 4 週 | DIC顯微鏡與實習Differential interference contrast (DIC) microscopy |
| 第 5 週 | 螢光顯微鏡與實習Fluorescence microscopy and lab |
| 第 6 週 | 共軛焦顯微鏡與實習Confocal microscopy and lab |
| 第 7 週 | 清明節Development of fluorescent proteins and probes |
| 第 8 週 | 螢光蛋白與分子螢光探針之發展Multi-photon microscopy and lab |
| 第 9 週 | 多光子顯微鏡與實習Midterm exam |
| 第 10 週 | 期中考Spectral imaging, FRAP, FLIP, and FSM |
| 第 11 週 | 高等螢光顯微鏡:Spectral imaging, FRAP, FLIP, and FSMLive cell imaging and deconvolution microscopy |
| 第 12 週 | 活細胞顯微系統與Deconvolution microscopyFRET, FLIM, and Optical tweezers |
| 第 13 週 | 特殊光學顯微鏡:FRET, FLIMTotal internal reflection fluorescence (TIRF) microscopy, light-sheet microscopy, and Fluorescence correlation spectroscopy (FCS) |
| 第 14 週 | 特殊光學顯微鏡:Optical tweezers, Total internal reflection fluorescence (TIRF) microscopySuperresolution Microscopy: Near-field scanning optical microscope (NSOM), Stochastic optical reconstruction microscopy (STORM), Photoactivated localization microscopy (PALM), Stimulated emission depletion (STED) microscopy |
| 第 15 週 | 特殊光學顯微鏡:light-sheet microscopy, and Fluorescence correlation spectroscopy (FCS)Structured illumination microscopy (SIM), Super-resolution Optical Fluctuation Imaging (SOFI) |
| 第 16 週 | 超解像力顯微鏡:Near-field scanning optical microscope (NSOM), Stochastic optical reconstruction microscopy (STORM), Photoactivated localization microscopy (PALM), Stimulated emission depletion (STED) microscopyStudent presentation |
| 第 17 週 | 期末報告Student presentation |
| 第 18 週 | 期末考Final exam |