表面分析
Surface Analysis
學期
110-1
學分
3
學分
當期課號
5399
永久課號
IEV5676
開課單位
環境工程研究所
授課教師
張淑閔
校區
光復
類別
選修
上課時間表
| 節 | 週二 |
|---|---|
2 09:00–09:50 | 表面分析 EV407 3 節連堂 |
3 10:10–11:00 | |
4 11:10–12:00 |
* 根據陽明交大上課時間表所列
概述
This course introduces students several instrumental techniques for surface characterization. In addition, the principles and data interpretation of the analysis will be taught. Through these characterizations, students are able to identify the surface properties including chemical compositions, speciation, textures, and functional groups. These results can help students to better understand their materials and explore surface phenomenon in different environmental conditions.
評分方式
Midterm exam. (35 %)/ (Oct. 26, 2021) Final exam. (35 %) /(Nov. 30, 2021) Homework (20 %) Class participation (10 %)
課程大綱
- 1. Surface concept and instrumentation overview 2. Chemcial information of surface (AUGER, ESCA, SIMS, FTIR) 3. Structural information of surface (SPM)
週次計畫
| 週次 | 主題 |
|---|---|
| 第 1 週 | Course Introduction |
| 第 2 週 | Vacuum system |
| 第 3 週 | X-ray photoelectron spectroscopy (XPS) |
| 第 4 週 | X-ray photoelectron spectroscopy (XPS) |
| 第 5 週 | X-ray photoelectron spectroscopy (XPS) |
| 第 6 週 | Auger electron spectroscopy (AES) |
| 第 7 週 | Auger electron spectroscopy (AES) |
| 第 8 週 | Auger electron spectroscopy (AES) |
| 第 9 週 | Review |
| 第 10 週 | midterm |
| 第 11 週 | Secondary ion mass spectroscopy (SIMS) |
| 第 12 週 | Secondary ion mass spectroscopy (SIMS) |
| 第 13 週 | Secondary ion mass spectroscopy (SIMS) |
| 第 14 週 | Scanning probe microscopy (SPM) |
| 第 15 週 | Scanning electron microscope (SEM) |
| 第 16 週 | Fourier transform infrared spectroscopy (FTIR) |
| 第 17 週 | Review |
| 第 18 週 | final exam |
教科書
John C. Vickerman, "Surface Analysis_The Principal Technique", Wiley. (※ 請同學遵守智慧財產權觀念及勿使用非法影印教科書。 )
Office Hours
- 時間
- Flexible. Make appointments with e-mail.