元件電路計測實驗
Device and Circuit Characterization Laborotory
| 節 | 週三 |
|---|---|
5 13:20–14:10 | 元件電路計測實驗 LAB 2 節連堂 |
6 14:20–15:10 | |
A 18:30–19:20 | 元件電路計測實驗 LAB |
* 根據陽明交大上課時間表所列
The graduate-level course teaches fundamental DC and AC measurements for semiconductor devices with special emphasis on the MOSFET characterization. Students are expected to learn essential instrumentation and testing theory through both classroom lectures and hands-on experiment sessions. Prior knowledge on the semiconductor device physics is highly recommended.
Semiconductor Device Physics
https://dcpc.nctu.edu.tw/ *2/16因校慶停課一次,第一次上課時間為2/23。加選人數受限於實驗課最多八人,預加選同學請自行上網登記。除每日加退選外,於2/21日星期一晚上九點將按優先順序(電子所碩二、電子所博一、電子所碩一、電子所其他年級、產創及半導體碩一、其他碩博士班、電機電子大學部,其他大學部)由老師手動加選八人,同順位超過人數由登記加選名單中老師使用亂數抽籤決定。
Experimental report : group reports, 20% Operational examination : 3 examinations, 30% Written examination : 3 examinations, 30% Class & Lab participation : 20%
1. Class Notes 2. D. K. Schroder, Semiconductor Material and Device Characterization, 3rd ed., Wiley Interscience
- 地點
- ED409
- 時間
- By appointment
- 聯絡方式
- thhou@mail.nctu.edu.tw