元件輻射效應概論
Introduction to Radiation Effects in Electronics
學期
110-2
學分
3
學分
當期課號
5223
永久課號
CST5073
開課單位
國際半導體產業學院碩士班
授課教師
鍾錦翰
校區
光復
類別
選修
上課時間表
| 節 | 週五 |
|---|---|
5 13:20–14:10 | 元件輻射效應概論 EE116 3 節連堂 |
6 14:20–15:10 | |
7 15:30–16:20 |
* 根據陽明交大上課時間表所列
概述
了解輻射在電子元件中所產生的可靠度問題, 提升電子元件於核能設施與宇宙應用的效能 To understand the hazardous effects and reliability issues caused by radiation in electronic devices and how to mitigate them for the applications such as nuclear power facilities and space.
先修科目
基礎物理與半導體元件物理 Fundamental knowledge of physics and electronic devices
評分方式
Midterm exam (open note): 30% Final exam (open note): 40% Final report: 30%
週次計畫
| 週次 | 主題 |
|---|---|
| 第 1 週 | Introduction |
| 第 2 週 | Radiation Basics |
| 第 3 週 | Radiation Basics |
| 第 4 週 | Fundamentals of Radiation Effects |
| 第 5 週 | Fundamentals of Radiation Effects |
| 第 6 週 | Radiation Test Methods |
| 第 7 週 | Field Trip to Testing Facilities |
| 第 8 週 | Midterm Exam |
| 第 9 週 | SRIM & TRIM |
| 第 10 週 | SRIM & TRIM |
| 第 11 週 | Radiation Effects in Memories |
| 第 12 週 | Radiation Effects in GaN Devices |
| 第 13 週 | Application in Space |
| 第 14 週 | Case Study |
| 第 15 週 | Final Exam |
| 第 16 週 | School Holiday |
教科書
Terrestrial Radiation Effects in ULSI Devices and Electronic Systems, Eishi H. Ibe, Published by Wiley in 2015