校際選修

115-1 選課時程

進行中

  • 初選第一階段 6/15/2026
  • 初選第二階段 6/22/2026
  • 校際選修 8/24/2026
  • 初選第三階段 8/31/2026
  • 開學後加退選 9/7/2026
  • 逾期加退選 9/21/2026
選課資源

電子材料

Electronic Materials

學期
111-2
學分
3 學分
當期課號
516315
永久課號
ENMS20012
開課單位
材料科學與工程學系
授課教師
林御專
校區
光復
類別
選修
上課時間表
週五
6
14:20–15:10
電子材料
EF202
3 節連堂
7
15:30–16:20
8
16:30–17:20

* 根據陽明交大上課時間表所列

概述

1. To gain an understanding of the properties and applications of various materials (e.g. dielectrics, semiconductors) used in microelectronics and optoelectronics. 2. To apply the principles of physics, chemistry and structure to understand the fundamental phenomena contributing to the electrical and optical properties of materials. 3. To learn the fundamentals of thin film coatings, etching, and bulk crystal growth, including materials (gas) transport, epitaxy, and defects. To gain an understanding of the primary characterization methods that are used to study and measure the electrical, optical and physical properties of electronic and photonic materials.

先修科目

General Physics (普通物理) or General Chemistry(普通化學) or Thermodynamics(熱力學)

教學方式

電子材料作業繳交: 請各位同學繳交紙本至工六 EF755B 門口三層櫃上的箱子裡 (助教:湯惟竣)

評分方式

Homework: 30% Mid-Term Examination 35% Final Examination (close book) 35%

週次計畫
週次主題
第 1 週No class
第 2 週No class
第 3 週1.Introduction 2.Bonding
第 4 週1. Molecule Orbit Theory of Bonding 2. Semiconductor Band Structure 3. Effective Mass
第 5 週1.Intrinsic Semiconductors 2.Extrinsic Semiconductors 3.Electrical Characterization
第 6 週1.Resistivity Measurement 2.Hall-effect Measurement 3.Temperature Dependent of n, u, and Conductivity
第 7 週1.Vacuum Science & Technology 2.Thin Film & Surface Phenomena 3.Nucleation & Growth
第 8 週1.Bulk Crystal Growth 2.Thin Film Deposition/Epitaxy 3.Doping/Impurities/Defects
第 9 週1.Adsorption/Emission/Photoluminescence 2.Raman Spectroscopy
第 10 週Mid-term exam
第 11 週1.X-Ray Photoemission Spectroscopy 2.SIMS 3.Rutherford Back-Scattering
第 12 週1.MOSFET Introduction 2.Dielectric 3.PN Diodes
第 13 週1.Metal/Semiconductor Schottky Diode 2Ohmic Contacts
第 14 週1.Contact Resistance 2.C-V Measurement
第 15 週1.Schottky Barriers 2.Transistors
第 16 週Final exam
第 17 週
第 18 週
教科書

1. Principles of Electronic Materials and Devices (McGraw Hill, 4th Edition), by Safa Kasap 2. Semiconductor Material and Device Characterization (Wiley), by Dieter K. Schroder

Office Hours
地點
EF311
時間
Wednesday 1 PM - 3 PM
聯絡方式
ycl194@nycu.edu.tw (老師:林御專) zx7676812.en10@nycu.edu.tw(助教:湯惟竣)