表面分析技術
Surface Analysis Techniques
| 節 | 週二 |
|---|---|
5 13:20–14:10 | 表面分析技術 EF207 3 節連堂 |
6 14:20–15:10 | |
7 15:30–16:20 |
* 根據陽明交大上課時間表所列
In this course, we will introduce techniques for surface analysis and the physical mechanism, including scanning electron microscopy (SEM), Auger electron microscopy, X-ray photoelectron spectroscopy (XPS or ESCA), ultra-violet photoelectron spectroscopy (UPS), secondary ion mass spectroscopy (SIMS), ion scattering spectroscopy, vacuum technology, scanning probe microscopy (STM, AFM, etc.), low energy electron diffraction (LEED), and reflection high-energy electron diffraction (RHEED).
普通物理 (general physics),普通化學(general chemistry)。 Suggested: 量子力學 (quantum mechanics),固態物理 (solid-state physics),半導體物理與製程 (semiconductor physics and manufacturing)
The average of the midterm (40%) and the final examinations (45%) will contribute 85% of the final academic score. The rest (15%) depends on your class performance (quits and homework).
| 週次 | 主題 |
|---|---|
| 第 1 週 | Introduction |
| 第 2 週 | Scanning Electron Microscope (SEM) |
| 第 3 週 | SEM and EDS |
| 第 4 週 | Auger electron spectroscopy (AES) |
| 第 5 週 | AES |
| 第 6 週 | X-ray Photoelectron Spectroscopy (XPS) |
| 第 7 週 | XPS/ Lab tour |
| 第 8 週 | Midterm |
| 第 9 週 | Vacuum system |
| 第 10 週 | Secondary Ion Mass Spectroscopy (SIMS) |
| 第 11 週 | SIMS |
| 第 12 週 | Scanning Tunneling Microscopy |
| 第 13 週 | Scanning Tunneling Microscopy |
| 第 14 週 | Atomic Force Microscopy |
| 第 15 週 | Atomic Force Microscopy/ Final Project Discussion |
| 第 16 週 | Final project presentation |
PPT slide presentation in English. Lecture notes will be provided.
- 時間
- By appointment
- 聯絡方式
- yenlinhuang@nycu.edu.tw