電子材料
Electronic Materials
| 節 | 週二 | 週四 |
|---|---|---|
5 13:20–14:10 | 電子材料 EF207 2 節連堂 | 電子材料 EF207 |
6 14:20–15:10 |
* 根據陽明交大上課時間表所列
1. To gain an understanding of the properties and applications of various materials (e.g. dielectrics, semiconductors) used in microelectronics and optoelectronics. 2. To apply the principles of physics, chemistry and structure to understand the fundamental phenomena contributing to the electrical and optical properties of materials. 3. To learn the fundamentals of thin film coatings, etching, and bulk crystal growth, including materials (gas) transport, epitaxy, and defects. To gain an understanding of the primary characterization methods that are used to study and measure the electrical, optical and physical properties of electronic and photonic materials.
General Physics (普通物理) or General Chemistry(普通化學) or Thermodynamics(熱力學)
稍後更新
Homework: 30% Mid-Term Examination 35% Final Examination (close book) 35%
| 週次 | 主題 |
|---|---|
| 第 1 週 | Course Introduction |
| 第 2 週 | Molecule Orbit Theory of Bonding |
| 第 3 週 | Electronic Material Band Structure; Effective Mass |
| 第 4 週 | Intrinsic Semiconductors; Extrinsic Semiconductors |
| 第 5 週 | Electrical Characterization; Resistivity Measurement; Hall-effect Measurement |
| 第 6 週 | Temperature Dependence of Carrier Concentration, Carrier Mobility, and Conductivity |
| 第 7 週 | Vacuum Science and Technology; Thin Film and Surface Phenomena |
| 第 8 週 | Thin Film Deposition; Semiconductor Epitaxy; Bulk Crystal Growth |
| 第 9 週 | Material Characterization: Adsorption ,Emission, Photoluminescence, and Raman Spectroscopy |
| 第 10 週 | Material Characterization: X-Ray Photoemission Spectroscopy; SIMS Mid-Term Exam |
| 第 11 週 | Magnetic Materials; Piezoelectric Materials |
| 第 12 週 | Organic Elecctronic Materials; 2D Materials and Applications |
| 第 13 週 | MOSFET; Dielectric Materials; PN Diode |
| 第 14 週 | Metal-Semiconductor Schottky Diode; Schottky Contact; Ohmic Contact |
| 第 15 週 | FET Applications (TFET, Tunneling, Spin-FET); Memory Device |
| 第 16 週 | Contact Resistance Measurement; C-V Measurement |
| 第 17 週 | Course Review |
| 第 18 週 | Final Exam |
1. Principles of Electronic Materials and Devices (McGraw Hill, 4th Edition), by Safa Kasap 2. Semiconductor Material and Device Characterization (Wiley), by Dieter K. Schroder
- 地點
- EF311 or in the same classroom
- 時間
- Thursday 6-8
- 聯絡方式
- ycl194@nycu.edu.tw