校際選修

115-1 選課時程

進行中

  • 初選第一階段 6/15/2026
  • 初選第二階段 6/22/2026
  • 校際選修 8/24/2026
  • 初選第三階段 8/31/2026
  • 開學後加退選 9/7/2026
  • 逾期加退選 9/21/2026
選課資源

材料測試分析技術原理與應用

Principles and Applications of Materials Characterization Techniques

學期
112-2
學分
3 學分
當期課號
535910
永久課號
STST30035
開課單位
國際半導體產業學院碩士班
授課教師
蘇育陞
校區
光復
類別
選修
上課時間表
週五
2
09:00–09:50
材料測試分析技術原理與應用
EE132
3 節連堂
3
10:10–11:00
4
11:10–12:00

* 根據陽明交大上課時間表所列

概述

Semiconductor materials can be widely used not only in electronic devices/integrated circuits, but also in energy storage devices (Li-ion batteries) and solar cells. The focus of the lectures will be on the analytical methods on materials, but not on devices, which can be applied to other physical and chemical scientific research topics. This course is designed for young semiconductor talent interested in characterization techniques applied to semiconductor materials.

先修科目

Students with a degree in science or engineering (physics, chemistry, materials, electronics, semiconductors) may take this course.

評分方式

Attendance (bonus 10%); Homework Assignments (20%); Quiz (20%); Mid-term Exam (25%); Final Exam (25%)

週次計畫
週次主題
第 1 週Introduction to Semiconductor Materials – Warmup
第 2 週X-ray Diffraction (XRD) Analysis (I)
第 3 週X-ray Diffraction (XRD) Analysis (II)、X-ray Reflectometry (XRR)
第 4 週Electron Microscopy (EM) and Elemental Analysis (I)
第 5 週Electron Microscopy (EM) and Elemental Analysis (II)
第 6 週Advanced Cryo- and In-Situ Electron Microscopy (EM)、Atomic Force Microscopy (AFM)
第 7 週Spring break
第 8 週Mid-term Exam
第 9 週Applications of EM and AFM in Semiconductor Technologies
第 10 週X-ray Photoelectron Spectroscopy (XPS)、Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)、Ultraviolet-visible Spectroscopy (UV-vis)
第 11 週Applications of XPS、XRR、ToF-SIMS in Semiconductor Technologies
第 12 週Raman Spectroscopy、Fourier-Transform Infrared Spectroscopy (FTIR)
第 13 週Mass Spectrometry、Nuclear Magnetic Resonance (NMR) Spectroscopy
第 14 週Thermal Analysis、Particle Size Analysis、Surface Area and Porosity
第 15 週Electrochemical Analysis、Electrochemical Impedance Analysis (EIS)
第 16 週Final Exam
第 17 週
第 18 週
教科書

Presentation slides are provided by the instructor.

Office Hours
地點
EF475
時間
By appointment
聯絡方式
yushengsu@nycu.edu.tw