表面分析技術
Surface Analysis Techniques
| 節 | 週一 | 週四 |
|---|---|---|
2 09:00–09:50 | 表面分析技術 EF207 | |
5 13:20–14:10 | 表面分析技術 EF207 2 節連堂 | |
6 14:20–15:10 |
* 根據陽明交大上課時間表所列
Physical and chemical characterization principles are broadly used in materials science and engineering. Surface and interface characterization is a major subject in nanotechnology, heterogeneous catalysis, semiconductor devices, functional materials, corrosion, energy missions, and tribology, etc. This course will study the physical and chemical principles of representative characterization methods frequently used in these research areas. The topics include surface chemistry and physics fundamentals, electron-based and x-ray spectroscopy, vibrational spectroscopy, ellipsometry, microscopy with atomic-scale probes, and data analysis. Students will learn a foundation in the use of characterization techniques to solve and diagnose material problems related to composition, structure, defects, and surfaces that can be identified and potentially resolved with materials characterization.
普通物理 (general physics),普通化學(general chemistry)、基礎材料科學導論(introduction to materials sciences), 電子材料 (electronic materials),固態物理 (solid-state physics)
1. I am planning to teach it in Chinese on Monday (M56) and in English on Thursday (R2). 2. Before each exam, a review lecture will be provided to go over important knowledge. *Teaching Assistant: 謝伯聞 (碩二)
Attendance 50% ; Midterm exam 25% ; Final exam 25% ; Extra scores are possible by other means.
| 週次 | 主題 |
|---|---|
| 第 1 週 | Introduction, Vaccum Technology |
| 第 2 週 | Optical Microscopy (OM), Scanning Electron Microscopy (SEM) |
| 第 3 週 | SEM and EDS |
| 第 4 週 | Auger Electron Microscopy (AES) |
| 第 5 週 | Vibrational spectroscopy: Fourier Transform Infrared Spectroscopy, Raman Spectroscopy, Interpretation of Vibrational Data |
| 第 6 週 | X-ray photoelectron spectroscopy (XPS) |
| 第 7 週 | Review & Midterm exam |
| 第 8 週 | Secondary Ion Mass Spectroscopy (SIMS) and Thermal Analysis |
| 第 9 週 | Scanning probe microscopy (SPM) and scanning tunneling microscopy (STM) |
| 第 10 週 | Surfaces and interfaces of electronic materials and localized states at surfaces and interfaces |
| 第 11 週 | Electronic material surfaces and surface electronic applications |
| 第 12 週 | Analysis and characterization of next-generation material surfaces and interfaces |
| 第 13 週 | Review & Final exam |
| 第 14 週 | Presentations |
| 第 15 週 | No class |
| 第 16 週 | Presentations |
1. "Surface Analysis – The Principal Techniques" (2nd Edition) by John C. Vickerman, Ian S. Gilmore, John Wiley & Sons, 2009 2. "An Essential Guide to Electronic Material Surfaces and Interfaces" (1st Edition) by Leonard J. Brillson, Wiley, 2016
- 地點
- Room 311 - 工程六館
- 時間
- By appointment
- 聯絡方式
- ycl194@nycu.edu.tw