元件電路計測實驗
Device and Circuit Characterization Laboratory
| 節 | 週四 |
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6 14:20–15:10 | 元件電路計測實驗 ED201 3 節連堂 |
7 15:30–16:20 | |
8 16:30–17:20 |
* 根據陽明交大上課時間表所列
The graduate-level course teaches fundamental DC and AC measurements for semiconductor devices with special emphasis on the MOSFET characterization. Students are expected to learn essential instrumentation and testing theory through both classroom lectures and hands-on experiment sessions. Prior knowledge on the semiconductor device physics is highly recommended.
Semiconductor Device Physics
https://e3p.nycu.edu.tw/my/
Experimental report : group reports, 20% Operational examination : 3 examinations, 30% Written examination : 2 examinations, 30% Class & Lab participation : 20%
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1. Class Notes 2. D. K. Schroder, Semiconductor Material and Device Characterization, 3rd ed., Wiley Interscience
- 地點
- ED409
- 時間
- By appointment
- 聯絡方式
- thhou@nycu.edu.tw